Dynamic Secondary Ion Mass Spectroscopy Characterization System

Description

The objective of this solicitation is to select a supplier to manufacture, deliver, install, and commission a state-of-the-art Dynamic Secondary Ion Mass Spectrometry (SIMS) system. The proposed system must meet rigorous performance standards regarding sensitivity, depth resolution, and sample throughput. It must be capable of characterizing a comprehensive suite of semiconductor materials, including Group IV, III/V, III/Nitride, and II-VI compounds, and a wide range of elements. Additionally, the scope includes comprehensive post-installation support, including operator training and a long-term maintenance agreement to ensure high instrument uptime. All the deliverables must be received on or before March 31, 2027.