Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)

Description

The objective of this procurement is to install Cryo-Focused Ion Beam and scanning electron microscope (Cryo FIB/SEM) for high volume etching capability in the Development and Analytical Microscopy team of the NRC Quantum Nanotechnology Research Centre. This new Cryo FIB/SEM will replace our aging microscope and be part of the QN microscopy suite of equipment.