Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY

Description

{"description":" This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached. \n\n *** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. *** \n"} Solicitation Number: W911PT26QA041 Type: Solicitation Base Type: Solicitation NAICS: 811210 Classification Code: J036 Response Deadline: 2026-03-06T15:00:00-05:00 Office Address: WATERVLIET, NY Place of Performance: Watervliet, New York, 12189 POC: Katja Fox, katja.fox.civ@army.mil {"description":" This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached. \n\n *** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. *** \n"}