Atomic Force Microscope for use in a Scanning Electron Microscope
- Country
- United States
- Published
- February 10, 2026
- Deadline
- February 19, 2026
Description
{"description":" Please see attached combined synopsis/solicitation. \n"} Solicitation Number: 1333ND26QNB030045 Type: Combined Synopsis/Solicitation Base Type: Sources Sought NAICS: 334516 Classification Code: 6640 Response Deadline: 2026-02-19T17:00:00-05:00 Office Address: GAITHERSBURG, MD Place of Performance: Gaithersburg, Maryland, 20899 POC: Cielo Ibarra, cielo.ibarra@nist.gov {"description":" Please see attached combined synopsis/solicitation. \n"}
Get tenders like this in one daily alert
Use this notice as context when Tenqual drafts your search scope and fit criteria.