Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

Description

{"description":" This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details. \n"} Solicitation Number: 1333ND26QNB030053 Type: Combined Synopsis/Solicitation Base Type: Combined Synopsis/Solicitation NAICS: 334516 Classification Code: 6640 Response Deadline: 2026-02-23T16:30:00-05:00 Office Address: GAITHERSBURG, MD Place of Performance: Gaithersburg, Maryland, 20899 POC: Nina Lin, nina.lin@nist.gov POC: Forest Crumpler, forest.crumpler@nist.gov {"description":" This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details. \n"}