Semi-automatic prober for characterization of 200 mm wafers
IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up t...
Deadline Oct 13, 2026