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Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)

Lunds universitetSweden

Purchaser

Lunds universitet

Country

Sweden

Notice published

2 Jul 2026

Tenqual indexed

2 Jul 2026

Closing date

24 Aug 2026

Source ID

Docs found

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Tender summary

Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.

What to check before bidding

  • Issued by Lunds universitet.
  • Located in Sweden.
  • Source notice 456632-2026 on TED.
  • Notice published 2 Jul 2026; Tenqual indexed it 2 Jul 2026.
  • Deadline listed as 24 Aug 2026.
  • Create a free tender alert to catch similar opportunities before the deadline pressure starts.