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Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)

Purchaser

National Research Council of Canada (NRC)

Country

Canada

Published

29 Jan 2026

Closing date

6 Mar 2026

Source ID

Docs found

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Tender summary

The objective of this procurement is to install Cryo-Focused Ion Beam and scanning electron microscope (Cryo FIB/SEM) for high volume etching capability in the Development and Analytical Microscopy team of the NRC Quantum Nanotechnology Research Centre. This new Cryo FIB/SEM will replace our aging microscope and be part of the QN microscopy suite of equipment.

What to check before bidding

  • Issued by National Research Council of Canada (NRC).
  • Located in Canada.
  • Deadline listed as 6 Mar 2026.
  • Create a free tender alert to catch similar opportunities before the deadline pressure starts.