Field-Emission Scanning Electron Microscope (FE‑SEM) System

Tender summary

Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements. Field-Emission Scanning Electron Microscope (FE‑SEM) System Installation and Testing If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST. For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST. Signature on Page 1 of this document Proposal - Vendor shall provide two (2) priced configurations: Base System (no ultra-fast beam blanker) Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above) Lead Time Shipping Origin If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing. Country of Origin ANL-70B (Complete) Addendum 0001 (Review and Sign) Addendum 0002 (Review) Solicitation Number: 6-B175-Q-00131-00 Type: Solicitation Base Type: Solicitation NAICS: 334516 Classification Code: 6640 Response Deadline: 2026-02-06T17:00:00-06:00 Office Address: Lemont, IL POC: Jenna Doria-Garner, jdoria@anl.gov, 6302526988

What to check before bidding

• Located in United States.
• Source notice 47fdc79e0e1d46618edaa8e4afd5ef80 on SAM.gov.
• Notice published 26 Jan 2026; Tenqual indexed it 28 Jan 2026.
• Deadline listed as 6 Feb 2026.
• 7 tender documents identified.
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